| Semiconductor | DW-AVI System | W/D, D/A 공정 상의 2D 고속 검사 / 3D Height 측정 |
| Semiconductor | Mold AOI System | Mold 외관 검사 |
| Semiconductor | F/C Bonding Auto Loader & Unloader | PCB & Jig Vision Alignment & Auto Loading |
| Semiconductor | Module Inline System | Automatic Module Test Handler / 전산자동화 |
| Semiconductor | Packing Inline Automated System | Tray / Reel Packing 물류자동화/ 전산자동화 |
| Semiconductor | Wafer 3D Measuring System | Wafer Thickness 측정 |
| Semiconductor | TSV 3D Measuring System | Via-hole, A/R 3D 측정 |
| Semiconductor | NIR Crack Inspection System | (M/Z to M/Z)FCBGA TOP/BTM NIR 비전 Crack 검사 |
| Semiconductor | SWIR Defect Inspection System | (M/Z to M/Z, Tray to Tray) FCBGA SWIR 비전 Crack 검사 |
| Display (Film, LCD, OLED) | Film Auto Attach & Surface Inspection | MOF, Prism, Diffuser, Polarizer 필름검사 |
| Display (Film, LCD, OLED) | Copper Foil Surface Inspection System | Copper 표면검사 |
| Display (Film, LCD, OLED) | Glass Surface Inspection System | Glass Cutting면, 표면, 미세 크랙 등 비전 검사 |
| Display (Film, LCD, OLED) | Lighting Inspection System | Panel 점등 시 불량 화소 검사 및 Repair 좌표 측정 |
| Display (Film, LCD, OLED) | BLU_CG Attach System | 특허 |
| Secondary Battery | Battery Surface Inspection System | 용접 품질, 표면 검사 |
| Secondary Battery | Battery Film Surface Inspection System | 권취기 상에서의 Laser Notching 상태 품질 검사 |
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